ENGLISH

Advances in X-Ray Analysis: Volume 35B

By John V. Gilfrich , Ron Jenkins , Ting C. Huang , Charles S. Barrett , Gerald R. Lachance (auth.) , Gregory J. McCarthy , Paul K. Predecki , Richard Ryon , Deane K. Smith (eds.)

Book information

Publisher
Springer US
Year
1992
ISBN
978-1-4613-6532-7, 978-1-4615-3460-0
DOI
10.1007/978-1-4615-3460-0
Language
english
Format
PDF
Filesize
38 MB (40109046 bytes)
Pages
IV, 640 p.\607
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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