ENGLISH

Advances in X-Ray Analysis: Volume 32

By John V. Gilfrich , Ron Jenkins , Ting C. Huang , Paul K. Predecki (eds.) , Charles S. Barrett , John V. Gilfrich (auth.)

Book information

Publisher
Springer US
Year
1989
ISBN
978-1-4757-9112-9, 978-1-4757-9110-5
DOI
10.1007/978-1-4757-9110-5
Language
english
Format
PDF
Filesize
25 MB (26716530 bytes)
Pages
665\665
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

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