ENGLISH

Advances in X-Ray Analysis: Volume 37

By John V. Gilfrich , Ron Jenkins , I. Cev Noyan , Ting C. Huang , Paul K. Predecki , Deane K. Smith (eds.) , Ron Jenkins (auth.) , Charles C. Goldsmith

Book information

Publisher
Springer US
Year
1994
ISBN
978-1-4613-6077-3, 978-1-4615-2528-8
DOI
10.1007/978-1-4615-2528-8
Language
english
Format
PDF
Filesize
31 MB (32307680 bytes)
Pages
XXI, 756 p.\732
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.

Similar books