ENGLISH

Advances in X-Ray Analysis: Volume 33

By John V. Gilfrich , Ron Jenkins , Ting C. Huang , Paul K. Predecki (eds.) , Charles S. Barrett , B. K. Tanner (auth.)

Book information

Publisher
Springer US
Year
1990
ISBN
978-1-4613-9998-8, 978-1-4613-9996-4
DOI
10.1007/978-1-4613-9996-4
Language
english
Format
PDF
Filesize
22 MB (22634255 bytes)
Pages
XX, 704 p.\685
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

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