ENGLISH

Predictive Technology Model for Robust Nanoelectronic Design

By Yu Cao (auth.)

Book information

Publisher
Springer US
Year
2011
ISBN
1461404444, 9781461404446
DOI
10.1007/978-1-4614-0445-3
ISSN
1558-9412
Google Books ID
mTI5nuBmh74C
Language
english
Format
PDF
Filesize
2 MB (2236512 bytes)
Series
Integrated Circuits and Systems
Edition
1
Pages
173\190
Orientation
yes
Scanned
no
Time added
2012-02-14 18:00:00
Circuits and Systems; Electronics and MicroelectroInstrumentation; Nanotechnology; Performance and R

Description

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

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