Electrothermal Frequency References in Standard CMOS

Description

This book describes an alternative method of realizing accurate on-chip frequency references in standard CMOS processes. This method exploits the thermal-diffusivity of silicon, i.e. the rate at which heat diffuses through a silicon substrate. This is the first book describing the design of such electrothermal frequency references. It includes the necessary theory, supported by practical realizations that achieve inaccuracies as low as 0.1% and thus demonstrate the feasibility of this approach. The book also includes several circuit and system-level solutions to the precision circuit design challenges encountered during the design of such frequency references. Front Matter....Pages i-ix Introduction....Pages 1-13 Silicon-Based Frequency References....Pages 15-44 Frequency References Based on the Thermal Properties of Silicon....Pages 45-86 A Digitally-Assisted Electrothermal Frequency-Locked Loop in Standard CMOS....Pages 87-127 An Electrothermal Frequency Reference in Standard 0.7 μm CMOS....Pages 129-151 A Scaled Electrothermal Frequency Reference in Standard 0.16μm CMOS....Pages 153-185 Conclusions and Outlook....Pages 187-190 Back Matter....Pages 191-214