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ENGLISH

System-on-Chip Test Architectures. Nanometer Design for Testability

By Laung-Terng Wang , Charles E. Stroud and Nur A. Touba (Eds.)

Book information

Publisher: Morgan Kaufmann
Year: 2008
ISBN: 978-0-12-373973-5
Language: english
Format: PDF
Filesize: 22 MB (22909520 bytes)
Pages: 862\862
Time added: 2013-10-31 03:56:25

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