ENGLISH

VLSI Test Principles and Architectures: Design for Testability

By Laung-Terng Wang , Cheng-Wen Wu , Xiaoqing Wen

Book information

Publisher
Morgan Kaufmann
Year
2006
ISBN
0123705975, 9780123705976
Open Library ID
OL17200223M
Language
english
Format
PDF
Filesize
23 MB (24107747 bytes)
Series
Systems on Silicon
Edition
1
Pages
798\798
Library
demonoid.me
Time added
2011-03-04 03:37:09

Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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