ENGLISH

Test and diagnosis for small-delay defects

By Mohammad Tehranipoor , Ke Peng , Krishnendu Chakrabarty (auth.)

Book information

Publisher
Springer-Verlag New York
Year
2012
ISBN
9781441982971, 1441982973
DOI
10.1007/978-1-4419-8297-1
Language
english
Format
PDF
Filesize
7 MB (6934372 bytes)
Edition
1
Pages
212\228
Library
usenet tech
Time added
2013-03-30 20:00:00
Circuits and Systems; Performance and Reliability;

Description

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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