ENGLISH

Test and Diagnosis for Small-Delay Defects

By Mohammad Tehranipoor , Ke Peng , Krishnendu Chakrabarty (auth.)

Book information

Publisher
Springer-Verlag New York
Year
2012
ISBN
1441982965, 9781441982964
DOI
10.1007/978-1-4419-8297-1
Google Books ID
JeMz2QOtjUIC
Language
english
Format
PDF
Filesize
4 MB (3790054 bytes)
Edition
1
Pages
212\231
Orientation
yes
Scanned
no
Time added
2012-02-14 18:00:00
Circuits and Systems; Performance and Reliability;

Description

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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