System-on-Chip Security: Validation and Verification

Description

This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs. Front Matter ....Pages i-xix System-on-Chip Security Vulnerabilities (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 1-13 SoC Security Verification Challenges (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 15-35 SoC Trust Metrics and Benchmarks (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 37-57 Anomaly Detection Using Symbolic Algebra (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 59-97 Trojan Localization Using Symbolic Algebra (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 99-114 Vulnerability Assessment of Controller Designs (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 115-135 SoC Security Verification Using Property Checking (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 137-152 Automated Test Generation for Detection of Malicious Functionality (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 153-171 Trojan Detection Using Machine Learning (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 173-188 Trojan Detection Using Dynamic Current Analysis (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 189-219 Hardware Trojan Detection Schemes Using Path Delay and Side-Channel Analysis (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 221-271 The Future of Security Validation and Verification (Farimah Farahmandi, Yuanwen Huang, Prabhat Mishra)....Pages 273-279 Back Matter ....Pages 281-289