ENGLISH

Ageing of Integrated Circuits: Causes, Effects and Mitigation Techniques

Book information

Publisher
Springer International Publishing
Year
2020
ISBN
978-3-030-23780-6, 978-3-030-23781-3
Language
english
Format
PDF
Filesize
11 MB (11098762 bytes)
Edition
1st ed. 2020
Pages
XIII, 228\231
Time added
2020-02-08 04:41:22

Description

This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Front Matter ....Pages i-xiii Front Matter ....Pages 1-1 Understanding Ageing Mechanisms (Domenik Helms)....Pages 3-34 The Effects of Ageing on the Reliability and Performance of Integrated Circuits (Daniele Rossi)....Pages 35-64 Front Matter ....Pages 65-65 Aging Mitigation Techniques for Microprocessors Using Anti-aging Software (Haider Muhi Abbas, Mark Zwolinski, Basel Halak)....Pages 67-89 Ageing Mitigation Techniques for SRAM Memories (Mohd Syafiq Mispan, Mark Zwolinski, Basel Halak)....Pages 91-111 Ageing-Aware Logic Synthesis (Shengyu Duan, Mark Zwolinski, Basel Halak)....Pages 113-145 Front Matter ....Pages 147-147 On-Chip Ageing Monitoring and System Adaptation (Lorena Anghel, Florian Cacho, Riddhi Jitendrakumar Shah)....Pages 149-180 Aging Monitors for SRAM Memory Cells and Sense Amplifiers (Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas)....Pages 181-210 A Cost-Efficient Aging Sensor Based on Multiple Paths Delay Fault Monitoring (Gaole Sai, Mark Zwolinski, Basel Halak)....Pages 211-223 Back Matter ....Pages 225-228

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