Kelvin Probe Force Microscopy

Description

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. Front Matter ....Pages i-xxiv Front Matter ....Pages 1-1 Experimental Technique and Working Modes (Sascha Sadewasser, Thilo Glatzel)....Pages 3-22 Dissipation Modulated Kelvin Probe Force Microscopy Method (Yoichi Miyahara, Peter Grütter)....Pages 23-47 Dynamic Modes in Kelvin Probe Force Microscopy: Band Excitation and G-Mode (Stephen Jesse, Liam Collins, Sabine Neumayer, Suhas Somnath, Sergei V. Kalinin)....Pages 49-99 Practical Aspects of Kelvin Probe Force Microscopy in Liquids (Kei Kobayashi, Hirofumi Yamada)....Pages 101-118 Time-Resolved Electrostatic and Kelvin Probe Force Microscopy (Sascha Sadewasser, Nicoleta Nicoara)....Pages 119-143 Front Matter ....Pages 145-145 Imaging Static Charge Distributions: A Comprehensive KPFM Theory (Philipp Rahe, Hagen Söngen)....Pages 147-170 Interpretation of KPFM Data with the Weight Function for Charges (Hagen Söngen, Philipp Rahe, Ralf Bechstein, Angelika Kühnle)....Pages 171-200 Precise Modeling of Electrostatic Interactions with Dielectric Samples in Kelvin Probe Force Microscopy (Ali Sadeghi)....Pages 201-226 Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductors (Leo Polak, Rinke J. Wijngaarden)....Pages 227-247 Front Matter ....Pages 249-249 Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes (Evgheni Strelcov, Mahshid Ahmadi, Sergei V. Kalinin)....Pages 251-329 Kelvin Probe Force Microscopy Characterization of Organic and Hybrid Perovskite Solar Cells (Benjamin Grévin)....Pages 331-365 KPFM of Nanostructured Electrochemical Sensors (Alex Henning, Yossi Rosenwaks)....Pages 367-389 Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in Liquid (Liam Collins, Stefan A.L. Weber, Brian J. Rodriguez)....Pages 391-433 Front Matter ....Pages 435-435 Kelvin Probe Force Microscopy with Atomic Resolution (Yan Jun Li, Haunfei Wen, Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara)....Pages 437-463 The Electrostatic Field of CO Functionalized Metal Tips (Michael Ellner, Pablo Pou, Ruben Perez)....Pages 465-497 Imaging Charge Distribution Within Molecules by Scanning Probe Microscopy (Martin Ondráček, Prokop Hapala, Martin Švec, Pavel Jelínek)....Pages 499-518 Back Matter ....Pages 519-521