ENGLISH

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

By S. Sadewasser , Th. Glatzel (auth.) , Sascha Sadewasser , Thilo Glatzel (eds.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2012
ISBN
978-3-642-22565-9, 978-3-642-22566-6
DOI
10.1007/978-3-642-22566-6
Language
english
Format
PDF
Filesize
11 MB (11155152 bytes)
Series
Springer Series in Surface Sciences 48
Edition
1
Pages
334\330
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Heat and Mass TransferSurfaces and InterfacesThin Films;Thermodynamics;Engineering Thermodynami

Description

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Similar books