ENGLISH

CMOS RF Circuit Design for Reliability and Variability

By Jiann-Shiun Yuan (auth.)

Book information

Publisher
Springer Singapore
Year
2016
ISBN
978-981-10-0882-5, 978-981-10-0884-9
DOI
10.1007/978-981-10-0884-9
Language
english
Format
PDF
Filesize
5 MB (5493383 bytes)
Series
SpringerBriefs in Applied Sciences and Technology
Edition
1
Pages
VI, 106\108
Time added
2016-07-20 04:00:00
Circuits and Systems; Electronic Circuits and DeviRF and Optical Engineering

Description

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

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