ENGLISH

Process Variations and Probabilistic Integrated Circuit Design

By Joachim Haase , Manfred Dietrich (auth.) , Manfred Dietrich , Joachim Haase (eds.)

Book information

Publisher
Springer-Verlag New York
Year
2012
ISBN
144196620X, 9781441966209
DOI
10.1007/978-1-4419-6621-6
LCC
2011940313
Google Books ID
43SdFYKJ47gC
Language
english
Format
PDF
Filesize
5 MB (4839678 bytes)
Edition
1
Pages
252\261
Orientation
yes
Scanned
no
Time added
2012-02-14 18:00:00
CAE) and DesignCircuits and Systems; Computer-Aided Engineering (

Description

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

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