ENGLISH

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA

By ASM International

Book information

Publisher
ASM International
Year
2014
ISBN
1-62708-074-0, 978-1-62708-074-3, 9781627080750, 1627080759, 9781680155143, 1680155148
Language
english
Format
PDF
Filesize
58 MB (60634802 bytes)
Pages
560\560
Time added
2016-05-22 07:20:00

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis

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