ENGLISH

Istfa 2008 : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA

By ASM International

Book information

Publisher
ASM International
Year
2008
ISBN
978-0-87170-714-7, 0-87170-714-4
Language
english
Format
PDF
Filesize
83 MB (86821017 bytes)
Pages
528\550
Time added
2016-01-24 03:00:00
Electronics -- Materials -- Testing -- Congresses.

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results

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