ENGLISH

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

By Ray F. Egerton (auth.)

Book information

Publisher
Springer US
Year
2005
ISBN
978-0-387-25800-3, 978-0-387-26016-7
DOI
10.1007/b136495
Language
english
Format
PDF
Filesize
7 MB (7512625 bytes)
Edition
1
Pages
202\206
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Characterization and Evaluation of Materials; Nano

Description

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

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