ENGLISH

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

By Alexei Gruverman (eds.) , S. V. Kalinin , A. Gruverman (auth.) , Sergei Kalinin

Book information

Publisher
Springer-Verlag New York
Year
2007
ISBN
978-0-387-28667-9, 978-0-387-28668-6
DOI
10.1007/978-0-387-28668-6
Language
english
Format
PDF
Filesize
39 MB (40501457 bytes)
Edition
1
Pages
980\1001
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Characterization and Evaluation of Materials; NanoThin Films; Biological Microscopy; Mechanical Engi

Description

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

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