ENGLISH

Fault Diagnosis and Fault Tolerance: A Systematic Approach to Special Topics

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
1992
ISBN
978-3-540-54962-8, 978-3-642-77179-8
DOI
10.1007/978-3-642-77179-8
Language
english
Format
PDF
Filesize
12 MB (13000866 bytes)
Edition
1
Pages
197\206
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

With the rapid growth of integration scale of VLSI chips and the present need for reliable computers in space exploration, fault diagnosis and fault toleran­ ce have become more important than before, and hence reveal a lot of interest­ ing topics which attract many researchers to make a great number of contribu­ tions to this field. In recent years, many new and significant results have been achieved. A quick scan over the proceedings of the conferences on fault­ tolerant computing and design automation as well as on testing will convince the reader of that. But unfortunately these achievements have not been entire­ ly reflected in the textbooks, so that there seems to be a gap for the new researcher who already has the basic knowledge and wants to begin research in this area. As a remedy for this deficiency, this book is intended for begin­ ners, especially graduate students, as a textbook which will lead them to the frontier of some branches of the fault-tolerant computing field. The first chapter introduces the four-valued logic B4 and its applica­ tions. In 1966 Roth first proposed this four-valued logic as a technique to generate tests for logical circuits, but this work did not concern the mathe­ matical basis of B4 itself.

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