ENGLISH

New Horizons of Applied Scanning Electron Microscopy

By Kenichi Shimizu , Tomoaki Mitani (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2010
ISBN
978-3-642-03159-5, 978-3-642-03160-1
DOI
10.1007/978-3-642-03160-1
Language
english
Format
PDF
Filesize
11 MB (11712842 bytes)
Series
Springer Series in Surface Sciences 45
Edition
1
Pages
182\171
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Surfaces and InterfacesThin Films;Measurement Science and Instrumentation

Description

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

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