ENGLISH

Advances in Scanning Probe Microscopy

By Naruo Sasaki , Masaru Tsukada (auth.) , Professor Toshio Sakurai , Professor Yousuke Watanabe (eds.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2000
ISBN
978-3-642-63084-2, 978-3-642-56949-4
DOI
10.1007/978-3-642-56949-4
Language
english
Format
PDF
Filesize
12 MB (12344423 bytes)
Series
Advances in Materials Research 2
Edition
1
Pages
343\350
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Surfaces and InterfacesThin Films;Optical and Electronic Materials;Solid

Description

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

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