ENGLISH

VLSI testing : digital and mixed analogue/digital techniques

By Hurst , Stanley Leonard

Book information

Publisher
Institution of Electrical Engineers
Year
1998
ISBN
0-85296-901-5, 9780852969014
Language
english
Format
PDF
Filesize
29 MB (29981733 bytes)
Series
IEE circuits and systems series 9
Edition
1
Pages
532\554
Time added
2016-04-05 23:00:00

Description

A comprehensive introduction and reference for all aspects of IC testing, this book includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing

Similar books