Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

Description

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost. Front Matter ....Pages i-xiv Introduction (Yuming Zhuang, Degang Chen)....Pages 1-5 Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Non-coherency and Large Distortion (Yuming Zhuang, Degang Chen)....Pages 7-31 Accurate Spectral Testing with Arbitrary Non-coherency in Sampling and Simultaneous Drifts in Amplitude and Frequency (Yuming Zhuang, Degang Chen)....Pages 33-57 High-Purity Sine Wave Generation Using Nonlinear DAC with Pre-distortion Based on Low-Cost Accurate DAC-ADC Co-testing (Yuming Zhuang, Degang Chen)....Pages 59-78 Low-Cost Ultrapure Sine Wave Generation with Self-Calibration (Yuming Zhuang, Degang Chen)....Pages 79-96 Accurate Spectral Testing with Non-coherent Sampling for Multi-tone Test (Yuming Zhuang, Degang Chen)....Pages 97-111 Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test (Yuming Zhuang, Degang Chen)....Pages 113-126 Multi-tone Sine Wave Generation Achieving the Theoretical Minimum of Peak-To-Average Power Ratio (Yuming Zhuang, Degang Chen)....Pages 127-148 Accurate Linearity Testing Using Low-Purity Stimulus Robust against Flicker Noise (Yuming Zhuang, Degang Chen)....Pages 149-167 Summary (Yuming Zhuang, Degang Chen)....Pages 169-170