ENGLISH

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

By Bharat Bhushan (eds.) , Ali Fatih Sarioglu , Olav Solgaard (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2011
ISBN
978-3-642-10496-1, 978-3-642-10497-8
DOI
10.1007/978-3-642-10497-8
Language
english
Format
PDF
Filesize
24 MB (25351624 bytes)
Series
NanoScience and Technology
Edition
1
Pages
710\822
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Nanotechnology;Characterization and Evaluation ofThin Films;Nanotechnology and Microengineering;Con

Description

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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