ENGLISH

Languages, Design Methods, and Tools for Electronic System Design: Selected Contributions from FDL 2016

Book information

Publisher
Springer International Publishing
Year
2018
ISBN
978-3-319-62919-3, 978-3-319-62920-9
Language
english
Format
PDF
Filesize
5 MB (5164436 bytes)
Series
Lecture Notes in Electrical Engineering 454
Edition
1
Pages
VII, 116\122
Time added
2017-11-21 00:00:00

Description

This book brings together a selection of the best papers from the nineteenth edition of the Forum on specification and Design Languages Conference (FDL), which took place on September 14-16, 2016, in Bremen, Germany. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems. Front Matter ....Pages i-vii Knowing Your AMS System’s Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation (Georg Gläser, Hyun-Sek Lukas Lee, Markus Olbrich, Erich Barke)....Pages 1-14 Designing Reliable Cyber-Physical Systems (Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Goerschwin Fey et al.)....Pages 15-38 On the Application of Formal Fault Localization to Automated RTL-to-TLM Fault Correspondence Analysis for Fast and Accurate VP-Based Error Effect Simulation: A Case Study (Vladimir Herdt, Hoang M. Le, Daniel Große, Rolf Drechsler)....Pages 39-57 Error-Based Metric for Cross-Layer Cut Determination (A. Rafiev, F. Xia, A. Iliasov, R. Gensh, A. Aalsaud, A. Romanovsky et al.)....Pages 59-82 Feature-Based State Space Coverage Metric for Analog Circuit Verification (Andreas Fürtig, Sebastian Steinhorst, Lars Hedrich)....Pages 83-101 Error-Free Near-Threshold Adiabatic CMOS Logic in the Presence of Process Variation (Yue Lu, Tom J. Kazmierski)....Pages 103-114 Back Matter ....Pages 115-116

Similar books