ENGLISH

ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA

By International Symposium for Testing and Failure Analysis

Book information

Publisher
ASM International
Year
2006
ISBN
978-0-87170-844-1, 0-87170-844-2, 9781615030897, 1615030891
Language
english
Format
PDF
Filesize
105 MB (109725938 bytes)
Series
Proceedings: Intnl Symposium for Testing & Failure Analysis
Pages
524\544
Time added
2016-01-24 03:00:00
Electronics -- Materials -- Testing -- Congresses.

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results

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