ENGLISH

Physical Limitations of Semiconductor Devices

Book information

Publisher
Springer
Year
2008
ISBN
0387745130, 9780387745138
Language
english
Format
PDF
Filesize
8 MB (8620043 bytes)
Edition
1
Pages
330\337
Scanned
no
Time added
2012-03-17 06:00:00

Description

Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.

Similar books