ENGLISH

Design, Analysis and Test of Logic Circuits Under Uncertainty

By Igor L. Markov , John P. Hayes (auth.) , Smita Krishnaswamy

Book information

Publisher
Springer Netherlands
Year
2013
ISBN
978-90-481-9643-2, 978-90-481-9644-9
DOI
10.1007/978-90-481-9644-9
Language
english
Format
PDF
Filesize
3 MB (3515143 bytes)
Series
Lecture Notes in Electrical Engineering 115
Edition
1
Pages
124\129
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Circuits and Systems; Arithmetic and Logic Structu

Description

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

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