ENGLISH

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK

By B Daudin , J -L Rouvière , D Jalabert , J Coraux , V Favre-Nicolin , H Renevier , M H Cho (auth.) , Professor A. G. Cullis , Dr J. L. Hutchison (eds.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2005
ISBN
978-3-540-31914-6, 978-3-540-31915-3
DOI
10.1007/3-540-31915-8
Language
english
Format
PDF
Filesize
38 MB (39957204 bytes)
Series
Springer Proceedings in Physics 107
Edition
1
Pages
540\542
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
InstrumentationInstrumentation; Electronics and MicroelectronicsMaterials Science; Solid State Physics and Spectro

Description

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

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