Industrial X-Ray Computed Tomography

Description

This book acts as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. It presents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book also highlights where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0. Front Matter ....Pages i-v Introduction to Industrial X-ray Computed Tomography (Adam Thompson, Richard Leach)....Pages 1-23 Principles of X-ray Computed Tomography (Petr Hermanek, Jitendra Singh Rathore, Valentina Aloisi, Simone Carmignato)....Pages 25-67 X-ray Computed Tomography Devices and Their Components (Evelina Ametova, Gabriel Probst, Wim Dewulf)....Pages 69-98 Processing, Analysis and Visualization of CT Data (Christoph Heinzl, Alexander Amirkhanov, Johann Kastner)....Pages 99-142 Error Sources (Alessandro Stolfi, Leonardo De Chiffre, Stefan Kasperl)....Pages 143-184 Qualification and Testing of CT Systems (Markus Bartscher, Ulrich Neuschaefer-Rube, Jens Illemann, Fabrício Borges de Oliveira, Alessandro Stolfi, Simone Carmignato)....Pages 185-228 Towards Traceability of CT Dimensional Measurements (Massimiliano Ferrucci)....Pages 229-266 Applications of CT for Non-destructive Testing and Materials Characterization (Martine Wevers, Bart Nicolaï, Pieter Verboven, Rudy Swennen, Staf Roels, Els Verstrynge et al.)....Pages 267-331 Applications of CT for Dimensional Metrology (Andrea Buratti, Judith Bredemann, Michele Pavan, Robert Schmitt, Simone Carmignato)....Pages 333-369