Compendium of Surface and Interface Analysis

Description

This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose. Front Matter ....Pages i-xvi Acoustic Microscopy (Naohiro Hozumi)....Pages 1-8 Action Spectroscopy with STM (Kenta Motobayashi)....Pages 9-13 Ambient Pressure X-Ray Photoelectron Spectroscopy (Hiroshi Kondoh)....Pages 15-19 Angle-Resolved Ultraviolet Photoelectron Spectroscopy (Takafumi Sato)....Pages 21-26 Atom Probe Field Ion Microscope (Masahiko Tomitori)....Pages 27-32 Atomic Force Microscope (Shintaro Fujii)....Pages 33-37 Auger Electron Spectroscopy (Fumihiko Matsui)....Pages 39-44 Cathodoluminescence (Takashi Sekiguchi)....Pages 45-49 Conductive Atomic Force Microscopy (Risa Fuji)....Pages 51-54 Differential Interference Contrast Microscopy/Phase-Contrast Microscopy (Hiroshi Komatsu, Gen Sazaki)....Pages 55-60 Dynamic Secondary Ion Mass Spectrometry (Mitsuhiro Tomita)....Pages 61-65 Elastic Recoil Detection Analysis (Daiichiro Sekiba)....Pages 67-72 Electrochemical Atomic Force Microscopy (Toru Utsunomiya, Yasuyuki Yokota, Ken-ichi Fukui)....Pages 73-78 Electrochemical Infrared Spectroscopy (Shen Ye)....Pages 79-85 Electrochemical Scanning Tunneling Microscopy (Tomoaki Nishino)....Pages 87-90 Electrochemical Second Harmonic Generation (Ichizo Yagi)....Pages 91-95 Electrochemical Sum Frequency Generation (Hidenori Noguchi)....Pages 97-101 Electrochemical Surface X-Ray Scattering (Toshihiro Kondo)....Pages 103-108 Electrochemical Transmission Electron Microscopy (Yoshifumi Oshima)....Pages 109-112 Electrochemical X-Ray Absorption Fine Structure (Takuya Masuda)....Pages 113-118 Electrochemical X-Ray Photoelectron Spectroscopy (Takuya Masuda)....Pages 119-125 Electron Backscatter Diffraction (Rika Yoda)....Pages 127-132 Electron Energy-Loss Spectroscopy (Tadaaki Nagao)....Pages 133-138 Electron Probe Microanalysis (Hiroshi Sakamae)....Pages 139-142 Electron-Stimulated Desorption (Naoya Miyauchi)....Pages 143-147 Electron-Beam-Induced Current (Jun Chen, Takashi Sekiguchi)....Pages 149-154 Ellipsometry (Toshihide Tsuru)....Pages 155-164 Environmental SEM (Atmospheric SEM) (Yusuke Ominami)....Pages 165-169 Environmental Transmission Electron Microscopy (Tadahiro Kawasaki)....Pages 171-175 Extended X-Ray Absorption Fine Structure (Hitoshi Abe)....Pages 177-180 Focused Ion Beam Scanning Electron Microscope (Tetsuo Sakamoto)....Pages 181-186 Force Curve (Akinori Kogure)....Pages 187-191 Force Spectroscopy (Christina Puckert, Michael J. Higgins)....Pages 193-200 Frequency-Modulation Atomic Force Microscopy (Masayuki Abe)....Pages 201-204 Gap-Mode Raman Spectroscopy (Katsuyoshi Ikeda)....Pages 205-209 Glow Discharge Mass Spectrometry (Takashi Saka)....Pages 211-217 Glow Discharge Optical Emission Spectrometry (Patrick Chapon, Sofia Gaiaschi, Kenichi Shimizu)....Pages 219-228 Hard X-Ray Photoelectron Spectroscopy (Akira Sekiyama)....Pages 229-238 Helium Atom Scattering (Takahiro Kondo)....Pages 239-245 High-Resolution Elastic Recoil Detection Analysis (Kaoru Nakajima)....Pages 247-251 High-Resolution Electron Energy Loss Spectroscopy (Hiroshi Okuyama)....Pages 253-257 High-Resolution Rutherford Backscattering Spectrometry (Kaoru Nakajima)....Pages 259-262 High-Speed Atomic Force Microscopy (Takayuki Uchihashi)....Pages 263-267 Imaging Ellipsometry (Akiko N. Itakura)....Pages 269-274 Impact Collision Ion Scattering Spectroscopy (Masakazu Aono, Mitsuhiro Katayama)....Pages 275-282 Inelastic Electron Tunneling Spectroscopy (Akitoshi Shiotari)....Pages 283-288 Infrared External-Reflection Spectroscopy (Takeshi Hasegawa)....Pages 289-294 Infrared Reflection–Absorption Spectroscopy (Jun Yoshinobu)....Pages 295-299 Interferometer Displacement Measurement (Masaya Toda)....Pages 301-305 Inverse Photoemission Spectroscopy (Kaname Kanai)....Pages 307-312 Kelvin Probe Force Microscope (Risa Fuji)....Pages 313-317 Laser Ionization Secondary Neutral Mass Spectrometry (Tetsuo Sakamoto)....Pages 319-324 Laser Photoelectron Spectroscopy (Ryuichi Arafune)....Pages 325-329 Lateral Force Microscopy (Shiho Moriguchi)....Pages 331-335 Liquid SPM/AFM (Akinori Kogure)....Pages 337-341 Low-Energy Ion Scattering Spectroscopy (Kenji Umezawa)....Pages 343-348 Low-Energy Electron Diffraction (Yoshimi Horio)....Pages 349-353 Low-Energy Electron Microscope (H. Hibino)....Pages 355-360 Magnetic Force Microscopy (Masato Hirade)....Pages 361-364 Matrix-Assisted Laser Desorption/Ionization (Takaya Satoh)....Pages 365-369 Medium-Energy Ion Scattering (Tomoaki Nishimura)....Pages 371-374 Micro-Raman Spectroscopy (Katsumasa Fujita)....Pages 375-379 Microprobe Reflection High-Energy Electron Diffraction (Masakazu Ichikawa)....Pages 381-386 Multiple-Probe Scanning Probe Microscope (Tomonobu Nakayama)....Pages 387-394 Nanoscale Angle-Resolved Photoelectron Spectroscopy (Koji Horiba)....Pages 395-399 Nonlinear Spectroscopy (Shoichi Yamaguchi)....Pages 401-404 Nuclear Reaction Analysis (Markus Wilde, Katsuyuki Fukutani)....Pages 405-411 Optical Microscopy (Kazuya Kabayama, Ryugo Tero)....Pages 413-417 Optical Second-Harmonic Generation Spectroscopy and Microscopy (Khuat Thi Thu Hien, Goro Mizutani)....Pages 419-423 Particle-Induced X-Ray Emission (Koichiro Sera)....Pages 425-434 Penning Ionization Electron Spectroscopy (Takuya Hosokai)....Pages 435-440 Phase Mode SPM/AFM (Hideo Nakajima)....Pages 441-444 Photoelectron Diffraction (Fumihiko Matsui, Tomohiro Matsushita)....Pages 445-450 Photoelectron Holography (Tomohiro Matsushita, Fumihiko Matsui)....Pages 451-455 Photoelectron Yield Spectroscopy (Hisao Ishii)....Pages 457-463 Photoemission Electron Microscope (Toyohiko Kinoshita)....Pages 465-469 Photoluminescence (Yuhei Miyauchi)....Pages 471-476 Photon Emission from the Scanning Tunneling Microscope (Makoto Sakurai)....Pages 477-485 Photo-Stimulated Desorption (Akihiko Ikeda, Katsuyuki Fukutani)....Pages 487-492 Piezoresponse Force Microscope (Masato Hirade)....Pages 493-496 Positron-Annihilation-Induced Desorption Spectroscopy (Takayuki Tachibana, Yasuyuki Nagashima)....Pages 497-500 p-Polarized Multiple-angle Incidence Resolution Spectrometry (Takeshi Hasegawa)....Pages 501-507 Quartz Crystal Microbalance (Yuji Teramura, Madoka Takai)....Pages 509-520 Reflectance Difference Spectroscopy (Ken-ichi Shudo, Shin-ya Ohno)....Pages 521-526 Reflection High-Energy Electron Diffraction (Yoshimi Horio)....Pages 527-530 Resonant Inelastic X-Ray Scattering (Yoshihisa Harada)....Pages 531-537 Rutherford Backscattering Spectrometry (Daiichiro Sekiba)....Pages 539-543 Scanning Capacitance Microscopy (Nobuyuki Nakagiri)....Pages 545-549 Scanning Electrochemical Microscopy (Yasufumi Takahashi)....Pages 551-556 Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry (Masaki Morita)....Pages 557-561 Scanning Electron Microscopy (Yasuyuki Okano)....Pages 563-569 Scanning Helium Ion Microscope (Keiko Onishi, Daisuke Fujita)....Pages 571-575 Scanning Near-Field Optical Microscopy/Near-Field Scanning Optical Microscopy (Tetsuya Narushima)....Pages 577-582 Scanning Probe Microscopy (Ken Nakajima)....Pages 583-586 Scanning Transmission Electron Microscopy (Koji Kimoto)....Pages 587-592 Scanning Transmission X-Ray Microscopy (Yasuo Takeichi)....Pages 593-597 Scanning Tunneling Microscopy (Yukio Hasegawa)....Pages 599-604 Scanning Tunneling Spectroscopy (Keisuke Sagisaka)....Pages 605-610 Soft X-Ray Absorption Fine Structure (Kenta Amemiya)....Pages 611-614 Spectroscopic Ellipsometry (Takumi Moriyama)....Pages 615-621 Spin- and Angle-Resolved Photoelectron Spectroscopy (Taichi Okuda)....Pages 623-629 Spin-Polarized Scanning Electron Microscopy (Teruo Kohashi)....Pages 631-635 Spin-Polarized Scanning Tunneling Microscopy (Toyo Kazu Yamada)....Pages 637-641 Spin-Resolved Photoemission Electron Microscopy (Keiki Fukumoto)....Pages 643-649 Super-Resolution Microscopy (Kazuya Kabayama, Ryugo Tero)....Pages 651-656 Surface Acoustic Wave (Shinya Sasaki)....Pages 657-660 Surface Enhanced Raman Scattering (Katsuyoshi Ikeda)....Pages 661-665 Surface Magneto-Optic Kerr Effect (Takeshi Nakagawa)....Pages 667-671 Surface Plasmon Resonance (Kaoru Tamada)....Pages 673-678 Surface Profilometer (Masahiro Tosa)....Pages 679-682 Surface Sensitive Scanning Electron Microscopy (Yoshikazu Homma)....Pages 683-687 Surface X-Ray Diffraction (Etsuo Arakawa)....Pages 689-696 Surface-Enhanced Infrared Absorption Spectroscopy (Masatoshi Osawa)....Pages 697-706 Synchrotron Radiation Photoelectron Spectroscopy (Jun Fujii)....Pages 707-712 Synchrotron Scanning Tunneling Microscope (Toyoaki Eguchi)....Pages 713-717 Thermal Desorption Spectroscopy (Shohei Ogura, Katsuyuki Fukutani)....Pages 719-724 Time-of-Flight Secondary Ion Mass Spectrometry (Satoka Aoyagi)....Pages 725-731 Time-Resolved Photoelectron Spectroscopy (Iwao Matsuda)....Pages 733-740 Time-Resolved Photoemission Electron Microscopy (Atsushi Kubo)....Pages 741-748 Time-Resolved Scanning Tunneling Microscopy (Hidemi Shigekawa)....Pages 749-753 Tip-Enhanced Raman Scattering (Norihiko Hayazawa)....Pages 755-761 Total Reflection X-Ray Fluorescence (Jun Kawai)....Pages 763-768 Transmission Electron Diffraction (Yoshio Matsui)....Pages 769-774 Transmission Electron Microscope (Masanori Mitome)....Pages 775-781 Ultraviolet Photoelectron Spectroscopy (Kenichi Ozawa)....Pages 783-790 Ultraviolet–Visible Spectrophotometry (Hiro Amekura)....Pages 791-799 Vibrational Sum Frequency Generation Spectroscopy (Satoshi Nihonyanagi, Tahei Tahara)....Pages 801-807 X-Ray Absorption Near Edge Structure (Hitoshi Abe)....Pages 809-813 X-Ray-Aided Noncontact Atomic Force Microscopy (Shushi Suzuki, Wang-Jae Chun, Masaharu Nomura, Kiyotaka Asakura)....Pages 815-819 X-Ray Crystal Truncation Rod Scattering (Tetsuroh Shirasawa)....Pages 821-825 X-Ray Magnetic Circular Dichroism (Kenta Amemiya)....Pages 827-831 X-Ray Photoelectron Spectroscopy (Makoto Nakamura)....Pages 833-842 X-Ray Reflectivity (Wolfgang Voegeli)....Pages 843-848 X-Ray Standing Wave Method (Akira Saito)....Pages 849-853