ENGLISH

Microscopy of semiconducting materials: proceedings of the 14th conference, April 11-14, 2005, Oxford, UK

By A.G. Cullis , J.L. Hutchison

Book information

Publisher
Springer
Year
2006
ISBN
354031914X, 9783540319146, 9783540319153
Open Library ID
OL9056263M
Language
english
Format
PDF
Filesize
30 MB (31248952 bytes)
Series
Springer Proceedings in Physics
Edition
1
Pages
543\543
Library
Kingdwarf
Scanned
yes
Time added
2010-01-07 06:59:20
Специальные дисциплины;Наноматериалы и нанотехноло

Description

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

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