ENGLISH

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

By Fabio Roli , Ana Fred , Dick de Ridder (eds.) , Thorsten Joachims (auth.) , Dit-Yan Yeung , James T. Kwok

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2006
ISBN
3540372369, 9783540372363
DOI
10.1007/11815921
Open Library ID
OL18270312M
Language
english
Format
PDF
Filesize
31 MB (32196460 bytes)
Series
Lecture Notes in Computer Science 4109 : Image Processing, Computer Vision, Pattern Recognition, and Graphics
Edition
1
Pages
939\958
Library
Kolxo3
Time added
2011-02-14 12:09:19
Pattern Recognition; Discrete Mathematics in Compu

Description

This book constitutes the refereed proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held jointly in Hong Kong, China in August 2006 as a satellite event of the 18th International Conference of Pattern Recognition, ICPR 2006. The 38 revised full papers and 61 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 217 submissions. The papers are organized in topical sections on image analysis, vision, character recognition, bayesian networks, graph-based methods, similarity and feature extraction, image and video, vision, kernel-based methods, recognition and classification, similarity and feature extraction, document analysis, graph-based methods, recognition and classification, image analysis, facial image analysis, representation, feature selection, clustering, multiple classifier systems, recognition and classification, unsupervised learning, dimensionality, representation, biometrics, and applications.

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