ENGLISH

Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

By Stephane Regnier , Hui Xie , Cagdas Onal , Metin Sitti (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2012
ISBN
3642203280, 9783642203282
DOI
10.1007/978-3-642-20329-9
ISSN
1610-7438
Language
english
Format
PDF
Filesize
9 MB (9066827 bytes)
Series
Springer Tracts in Advanced Robotics 71
Edition
1
Pages
344\359
Orientation
yes
Scanned
no
Time added
2012-03-09 12:00:00
Robotics and Automation; Artificial Intelligence (

Description

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

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