ENGLISH

X-Ray Spectroscopy: An Introduction

By Professor Bipin K. Agarwal Ph. D. (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
1991
ISBN
978-3-540-50719-2, 978-3-540-38668-1
DOI
10.1007/978-3-540-38668-1
Language
english
Format
PDF
Filesize
9 MB (9822542 bytes)
Series
Springer Series in Optical Sciences 15
Edition
2
Pages
421\421
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
MolecularOptical and Plasma PhysicsOpticsOptoelectronicsPlasmonics and Optical Devices;Atomic

Description

X-ray spectroscopy has emerged as a powerful tool in research and in industrial laboratories. It is used in the study of metals, semiconductors, amorphous solids, liquids and gases. This comprehensive presentation develops the subject from its basic principles and relates the theory to experimental observations. The new edition includes topics that have recently become important, for example, the X-ray laser, appearance potential spectroscopy, synchrotron radiation and EXAFS of high-Tc superconducting materials. A thorough introduction, up to research level, isprovided to EXAFS, which has seen rapid development in the past few years. This textbook conveniently presents the principles, applications and current techniques of X-ray spectroscopy, which makes it ideal for graduate students beginning research involving x-ray spectroscopy.

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