ENGLISH

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

By T. Hogg , G. Snider (auth.) , Mohammad Tehranipoor (eds.)

Book information

Publisher
Springer US
Year
2008
ISBN
978-0-387-74746-0, 978-0-387-74747-7
DOI
10.1007/978-0-387-74747-7
Language
english
Format
PDF
Filesize
9 MB (9944522 bytes)
Series
Frontiers in Electronic Testing 37
Edition
1
Pages
408\410
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Circuits and Systems; Electronics and MicroelectroInstrumentation; Nanotechnology; Quality ControlReliabilitySafety and Risk; Electrical Engineering

Description

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

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