Statistical Quality Technologies: Theory and Practice

Description

This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health. Front Matter ....Pages i-xix Front Matter ....Pages 1-1 Some Recent Studies in Statistical Process Control (Peihua Qiu)....Pages 3-19 Statistical Quality Control and Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications (Víctor Leiva, Carolina Marchant, Fabrizio Ruggeri, Helton Saulo)....Pages 21-53 Statistical System Monitoring (SSM) for Enterprise-Level Quality Control (Siim Koppel, Shing I Chang)....Pages 55-78 Enhanced Cumulative Sum Charts Based on Ranked Set Sampling (Mu’azu Ramat Abujiya, Muhammad Hisyam Lee)....Pages 79-108 A Survey of Control Charts for Simple Linear Profile Processes with Autocorrelation (Jyun-You Chiang, Hon Keung Tony Ng, Tzong-Ru Tsai, Yuhlong Lio, Ding-Geng Chen)....Pages 109-126 Sequential Monitoring of Circular Processes Related to the von Mises Distribution (Cornelis J. Potgieter)....Pages 127-150 Front Matter ....Pages 151-151 Time Truncated Life Tests Using the Generalized Multiple Dependent State Sampling Plans for Various Life Distributions (Muhammad Aslam, Gadde Srinivasa Rao, Mohammed Albassam)....Pages 153-182 Decision Theoretic Sampling Plan for One-Parameter Exponential Distribution Under Type-I and Type-I Hybrid Censoring Schemes (Deepak Prajapati, Sharmistha Mitra, Debasis Kundu)....Pages 183-210 Economical Sampling Plans with Warranty (Jyun-You Chiang, Hon Keung Tony Ng, Tzong-Ru Tsai, Yuhlong Lio, Ding-Geng Chen)....Pages 211-230 Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test (M. Kumar)....Pages 231-254 Front Matter ....Pages 255-255 Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests (Lu Lu, I-Chen Lee, Yili Hong)....Pages 257-275 The Stress-Strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family (Bing Xing Wang, Pei Hua Jiang, Xiaofei Wang)....Pages 277-295 A Degradation Model Based on the Wiener Process Assuming Non-Normal Distributed Measurement Errors (Yan Shen, Li-Juan Shen, Wang-Tu Xu)....Pages 297-329 An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring (Rong Pan, Kangwon Seo)....Pages 331-346 Robust Design in the Case of Data Contamination and Model Departure (Linhan Ouyang, Chanseok Park, Jai-Hyun Byun, Mark Leeds)....Pages 347-373 Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing (Tao Yuan, Suk Joo Bae, Yue Kuo)....Pages 375-393 Back Matter ....Pages 395-402