ENGLISH

Spectroscopy of Complex Oxide Interfaces

Book information

Publisher
Springer International Publishing
Year
2018
ISBN
978-3-319-74988-4, 978-3-319-74989-1
Language
english
Format
PDF
Filesize
16 MB (16339522 bytes)
Series
Springer Series in Materials Science 266
Edition
1st ed.
Pages
XIV, 320\326
Time added
2018-08-15 07:07:45

Description

This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering. Front Matter ....Pages i-xiv Introduction: Interfaces as an Object of Photoemission Spectroscopy (C. Cancellieri, Vladimir N. Strocov)....Pages 1-16 The \(\text {LaAlO}_3\)/\(\text {SrTiO}_3\) Interface: The Origin of the 2D Electron Liquid and the Fabrication (S. Gariglio, C. Cancellieri)....Pages 17-35 Transport Properties of TMO Interfaces (A. M. R. V. L. Monteiro, A. D. Caviglia, N. Reyren)....Pages 37-53 ARPES Studies of Two-Dimensional Electron Gases at Transition Metal Oxide Surfaces (Siobhan McKeown Walker, Flavio Y. Bruno, Felix Baumberger)....Pages 55-85 Photoelectron Spectroscopy of Transition-Metal Oxide Interfaces (M. Sing, R. Claessen)....Pages 87-105 Electrons and Polarons at Oxide Interfaces Explored by Soft-X-Ray ARPES (Vladimir N. Strocov, Claudia Cancellieri, Andrey S. Mishchenko)....Pages 107-151 Standing-Wave and Resonant Soft- and Hard-X-ray Photoelectron Spectroscopy of Oxide Interfaces (Slavomír Nemšák, Alexander X. Gray, Charles S. Fadley)....Pages 153-179 Ab-Initio Calculations of TMO Band Structure (A. Filippetti)....Pages 181-213 Dynamical Mean Field Theory for Oxide Heterostructures (O. Janson, Z. Zhong, G. Sangiovanni, K. Held)....Pages 215-243 Spectroscopic Characterisation of Multiferroic Interfaces (M.-A. Husanu, C. A. F. Vaz)....Pages 245-281 Oxides and Their Heterostructures Studied with X-Ray Absorption Spectroscopy and Resonant Inelastic X-Ray Scattering in the “Soft” Energy Range (M. Salluzzo, G. Ghiringhelli)....Pages 283-314 Back Matter ....Pages 315-320

Similar books