Hardware and Software: Verification and Testing: Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007. Proceedings
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This book constitutes the thoroughly refereed post-conference proceedings of the Third International Haifa Verification Conference, HVC 2007, held in Haifa, Israel, in October 2007. The 15 revised full papers presented together with 4 invited lectures were carefully reviewed and selected from 32 submissions. The papers are organized in topical tracks on hardware verification, model checking, dynamic hardware verification, merging formal and testing, formal verification for software and software testing. Front Matter....Pages - Simulation vs. Formal: Absorb What Is Useful; Reject What Is Useless....Pages 1-7 Scaling Commercial Verification to Larger Systems....Pages 8-13 From Hardware Verification to Software Verification: Re-use and Re-learn....Pages 14-15 Where Do Bugs Come from?....Pages 16-16 Symbolic Execution and Model Checking for Testing....Pages 17-18 On the Characterization of Until as a Fixed Point Under Clocked Semantics....Pages 19-33 Reactivity in SystemC Transaction-Level Models....Pages 34-50 Verifying Parametrised Hardware Designs Via Counter Automata....Pages 51-68 How Fast and Fat Is Your Probabilistic Model Checker? An Experimental Performance Comparison....Pages 69-85 Constraint Patterns and Search Procedures for CP-Based Random Test Generation....Pages 86-103 Using Virtual Coverage to Hit Hard-To-Reach Events....Pages 104-119 Test Case Generation for Ultimately Periodic Paths....Pages 120-135 Dynamic Testing Via Automata Learning....Pages 136-152 On the Architecture of System Verification Environments....Pages 153-168 Exploiting Shared Structure in Software Verification Conditions....Pages 169-184 Delayed Nondeterminism in Model Checking Embedded Systems Assembly Code....Pages 185-201 A Complete Bounded Model Checking Algorithm for Pushdown Systems....Pages 202-217 Locating Regression Bugs....Pages 218-234 The Advantages of Post-Link Code Coverage....Pages 235-251 GenUTest: A Unit Test and Mock Aspect Generation Tool....Pages 252-266 Back Matter....Pages -
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