ENGLISH

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

By Takashi Nakamura , Eishi Yahagi , Hideaki Kameyama , Mamoru Baba

Book information

Publisher
World Scientific Publishing Company
Year
2008
ISBN
9789812778819, 9812778810
Open Library ID
OL17104636M
Language
english
Format
PDF
Filesize
14 MB (14648298 bytes)
Pages
364\364
Time added
2010-05-31 00:48:14

Description

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features. Contents: Terrestrial Neutron Spectrometry and Dosimetry; Irradiation Testing in the Terrestrial Field; Neutron Irradiation Test Facilities; Review and Discussion of Experimental Data; Monte Carlo Simulation Methods; Simulation Results and Their Implications; International Standardization of the Neutron Test Method; Summary and Challenges.

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