ENGLISH

Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility

Book information

Publisher
Springer US
Year
2006
ISBN
978-0-387-26600-8, 978-0-387-26601-5
DOI
10.1007/b137864
Language
english
Format
PDF
Filesize
12 MB (12660685 bytes)
Edition
1
Pages
473\477
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

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