ENGLISH

CMOS Test and Evaluation: A Physical Perspective

By Manjul Bhushan , Mark B. Ketchen (auth.)

Book information

Publisher
Springer-Verlag New York
Year
2015
ISBN
978-1-4939-1348-0, 978-1-4939-1349-7
DOI
10.1007/978-1-4939-1349-7
Language
english
Format
PDF
Filesize
20 MB (20574804 bytes)
Edition
1
Pages
424\431
Time added
2015-04-23 16:00:00
Electronics and MicroelectronicsInstrumentation; Circuits and Systems; SemiconductReliabilitySafety and Risk

Description

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

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