ENGLISH

Microelectronics Reliability: Physics-of-Failure Based Modeling and Lifetime Evaluation

By White M. , Bernstein J.B.

Book information

Language
english
Format
PDF
Filesize
6 MB (6573809 bytes)
Pages
\216
Library
twirpx
Time added
2017-08-07 07:01:42
Машиностроение и материалообработка;Теория надежно

Description

Book 2008, California, 216 p. NASA WBS: 939904.01.11.10Contents Introduction Electron Device Physics of Failure Failure Rate Based SPICE (FaRBS) Reliability Simulation Microelectronic Circuit Reliability Analysis and MACRO Microelectronic System Reliability

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