ENGLISH

Nano-CMOS and post-CMOS electronics : circuits and design, Volume 2

Book information

Publisher
The Institution of Engineering and Technology
Year
2016
ISBN
184919999X, 978-1-84919-999-5, 978-1-78561-000-4, 1785610007
Language
english
Format
PDF
Filesize
15 MB (16011658 bytes)
Series
Materials Circuits and Devices 30
Pages
448\439
Time added
2018-02-03 10:00:00

Description

Continuing from volume 1, this volume outlines circuit- and system-level design approaches and issues for these devices. Topics covered include self-healing analog/RF circuits; on-chip gate delay variability measurement in scaled technology; FinFET SRAM circuits; nanoscale FinFET devices for PVT aware SRAM; low leakage variability aware CMOS logic circuits; thermal effects in MWCNT VLSI interconnects; an accurate PVT-aware statistical logic library for nano-CMOS integrated circuits; SPICEless RTL design optimization of nano-electronic digital integrated circuits; power-delay trade-off driven optimal scheduling of CDFGs during high level synthesis; green on-chip inductors for three-dimensional integrated circuits; 3D NoC -- a promising alternative for tomorrow’s nano-system design; and DNA computing Content: Preface -- 1. Self-healing analog/RF circuits -- 2. On-chip gate delay variability measurement in scaled technology node -- 3. Nanoscale FinFET devices for PVT-aware SRAM -- 4. Data stability and write ability enhancement techniques for FinFET SRAM circuits -- 5. Low-leakage techniques for nanoscale CMOS circuits -- 6. Thermal effects in carbon nanotube VLSI interconnects -- 7. Lumped electro-thermal modeling and analysis of carbon nanotube interconnects -- 8. High-level synthesis of digital integrated circuits in the nanoscale mobile electronics era.

Similar books