ENGLISH

Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

By Otwin Breitenstein , Wilhelm Warta , Martin Langenkamp (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2010
ISBN
9783642024160, 3642024165
DOI
10.1007/978-3-642-02417-7
Language
english
Format
PDF
Filesize
6 MB (6555330 bytes)
Series
Springer Series in Advanced Microelectronics 10
Edition
2
Pages
258\257
Library
usenet tech
Time added
2013-03-30 20:00:00
general;Structural MaterialsOpticsOptoelectronicsPlasmonics and Optical Devices;Characterization an

Description

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.

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