ENGLISH

Bias Temperature Instability for Devices and Circuits

By Andreas Kerber , Eduard Cartier (auth.) , Tibor Grasser (eds.)

Book information

Publisher
Springer-Verlag New York
Year
2014
ISBN
978-1-4614-7908-6, 978-1-4614-7909-3
DOI
10.1007/978-1-4614-7909-3
Language
english
Format
PDF
Filesize
26 MB (27362231 bytes)
Edition
1
Pages
810\805
Orientation
yes
Scanned
yes
Time added
2013-10-31 03:05:25
Circuits and Systems;Semiconductors;Electronics anInstrumentation;Quality ControlReliabilitySafety and Risk

Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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