International Tables for Crystallography Volume C: Mathematical, physical and chemical tables

Description

Volume C provides the mathematical, physical and chemical information needed for experimental studies in structural crystallography. The volume covers all aspects of experimental techniques, using all three principal radiation types, from the selection and mounting of crystals and production of radiation, through data collection and analysis, to interpretation of results. It is an essential source of information for all workers using crystallographic techniques in physics, chemistry, materials science, metallurgy, earth sciences and molecular biology. Contents Preface to the third edition 1.1. Summary of general formulae 1.2. Application to the crystal systems 1.3. Twinning 1.4. Arithmetic crystal classes and symmorphic space groups References, Chapter 1 2.1. Classification of experimental techniques 2.2. Single-crystal X-ray techniques 2.3. Powder and related techniques: X-ray techniques 2.4. Powder and related techniques: electron and neutron techniques 2.5. Energy-dispersive techniques 2.6. Small-angle techniques 2.7. Topography 2.8. Neutron diffraction topography 2.9 Neutron reflectometry References, Chapter 2 3.1. Preparation, selection, and investigation of specimens 3.2. Determination of the density of soilds 3.3. Mounting and setting of specimens for X-ray crystallographic studies 3.6. Specimens for neutron diffraction References, Chapter 3 4.1. Radiations used in crystallography 4.2. X-rays 4.3. Electron diffraction 4.4. Neutron techniques References, Chapter 4 5.1. Introduction 5.2. X-ray diffraction methods: polycristalline 5.3. X-ray diffraction methods: single crystal 5.4. Electron-diffraction methods 5.5. Neutron methods References, Chapter 5 6.1. Intensity of diffracted intensities 6.2. Trigonometric intensity factors 6.3. X-ray absorption 6.4. The flow of radiation in a real crystal References, Chapter 6 7.1. Detectors for X-rays 7.2. Detectors for electrons 7.3. Thermal neutron detection 7.4. Correction of systematic errors 7.5. Statistical fluctuations References, Chapter 7 8.1. Least squares 8.2. Other refinement methods 8.3. Constrains and restrains in refinement 8.4. Statistical significance tests 8.5. Detection and treatment of systematic error 8.6. The Rietveld method 8.7. Analysis of charge and spin densities 8.8. Accurate structure-factor determination with electron diffraction References, Chapter 8 9.1. Sphere packings and packings of ellipsoids 9.2. Layer stacking 9.3. Typical interatomic distances: metals and alloys 9.4. Typical interatomic distances: inorganic compounds 9.5. Typical interatomic distances: organic compounds 9.6. Typical interatomic distances: organometallic compounds and coordination complexes of the d- and f-block metals 9.7. The space-group distribution of molecular organic structures 9.8. Incommensurate and commensurate modulated structures References, Chapter 9 10.1. Introduction 10.2. Protection from ionizing radiation 10.3. Responsible bodies References, Chapter 10 Author Index Subject Index