ENGLISH

X-Ray Diffraction by Polycrystalline Materials

Book information

Year
2007
ISBN
1905209215, 9781905209217, 9781847045713
Open Library ID
OL8775646M
Language
english
Format
PDF
Filesize
5 MB (5742832 bytes)
Pages
351\384
Time added
2011-06-04 13:46:07

Description

This book presents a physical approach to the diffraction phenomenon and its applications in materials science.An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

Similar books